Papers: 10.3390/s21041033

https://doi.org/10.3390/s21041033

Deep Learning Approaches on Defect Detection in High Resolution Aerial Images of Insulators

Cited by: 44
Author(s): Qiaodi Wen, Ziqi Luo, Ruitao Chen, Yifan Yang, Guofa Li
Published: over 5 years ago

Software Mentions 2

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