Papers: 10.3390/s19153398

https://doi.org/10.3390/s19153398

An Improved Low-Noise Processing Methodology Combined with PCL for Industry Inspection Based on Laser Line Scanner

Cited by: 14
Author(s): Jianxiong Li, Qian Zhou, Xinghui Li, Ruimin Chen, Kai Ni
Published: about 7 years ago

Software Mentions 1