Papers: 10.1371/journal.pone.0143890

https://doi.org/10.1371/journal.pone.0143890

Using Next Generation Sequencing for Multiplexed Trait-Linked Markers in Wheat

Cited by: 27
Author(s): Amy Bernardo, Shan Wang, Paul St. Amand, Guihua Bai
Published: almost 11 years ago

Software Mentions 1