Papers: 10.1107/S2052252520013482

https://doi.org/10.1107/S2052252520013482

High-resolution cryo-EM using beam-image shift at 200 keV

Cited by: 13
Author(s): Jennifer N. Cash, Sarah Kearns, Yilai Li, Michael A. Cianfrocco
Published: almost 6 years ago

Software Mentions 1