Papers: 10.1107/S2052252517014324

https://doi.org/10.1107/S2052252517014324

Analysis of XFEL serial diffraction data from individual crystalline fibrils

Cited by: 16
Author(s): David H. Wojtas, Kartik Ayyer, Mao Liang, Estelle Mossou, Filippo Romoli, Carolin Seuring, Kenneth R. Beyerlein, Richard Bean, Andrew J. Morgan, D. Oberthüer, H. Fleckenstein, Michaël Heymann, Cornelius Gati, Oleksandr Yefanov, Miriam Barthelmeß, Eirini Ornithopoulou, Lorenzo Galli, P. Lourdu Xavier, Wai Li Ling, Matthias Frank, Chun Hong Yoon, Thomas A. White, Saša Bajt, Anna Mitraki, Sébastien Boutet, Andrew Aquila, Anton Barty, V. Trevor Forsyth, Henry N. Chapman, Rick P. Millane
Published: almost 8 years ago

Software Mentions 1