Papers: 10.1107/S2052252516001238

https://doi.org/10.1107/S2052252516001238

Whole-pattern fitting technique in serial femtosecond nanocrystallography

Cited by: 4
Author(s): Ruben A. Dilanian, Sophie Williams, Andrew V. Martin, V.A. Streltsov, Harry M. Quiney
Published: over 9 years ago

Software Mentions 1