Papers: 10.3390/s21155101

https://doi.org/10.3390/s21155101

Pragmatic Micrometre to Millimetre Calibration Using Multiple Methods for Low-Coherence Interferometer in Embedded Metrology Applications

Cited by: 3
Author(s): Tom Hovell, Jon N. Petzing, Laura Justham, Peter Kinnell
Published: about 5 years ago

Software Mentions 1