Papers: 10.3390/s21155101
https://doi.org/10.3390/s21155101
Pragmatic Micrometre to Millimetre Calibration Using Multiple Methods for Low-Coherence Interferometer in Embedded Metrology Applications
Cited by: 3
Author(s): Tom Hovell, Jon N. Petzing, Laura Justham, Peter Kinnell
Published: almost 4 years ago
Software Mentions 1
Very Likely Science (75)