Papers: 10.3390/s21103339

https://doi.org/10.3390/s21103339

On Combining Convolutional Autoencoders and Support Vector Machines for Fault Detection in Industrial Textures

Cited by: 8
Author(s): Alberto Tellaeche, Miguel Ángel Campos Anaya, Gonzalo Pajares, Iker Pastor-López
Published: over 5 years ago

Software Mentions 1

bioconductor: ADAM
ADAM: Activity and Diversity Analysis Module
Papers that mentioned: 482
Very Likely Science (100)