Papers: 10.3390/s20226620
https://doi.org/10.3390/s20226620
Reduction of Dark Current in CMOS Image Sensor Pixels Using Hydrocarbon-Molecular-Ion-Implanted Double Epitaxial Si Wafers
Cited by: 6
Author(s): Ayumi Onaka‐Masada, Takeshi Kadono, Ryosuke Okuyama, Ryo Hirose, Kōji Kobayashi, Akihiro Suzuki, Yoshio Koga, Kazunari Kurita
Published: over 5 years ago
Software Mentions 1
bioconductor: IVAS
Identification of genetic Variants affecting Alternative SplicingPapers that mentioned: 49
Very Likely Science (100)