Papers: 10.3390/s20174759

https://doi.org/10.3390/s20174759

Improved Defect Detection of Guided Wave Testing Using Split-Spectrum Processing

Cited by: 6
Author(s): Seyed Kamran Pedram, Tat-Hean Gan, Mahdieh Ghafourian
Published: almost 6 years ago

Software Mentions 1