Papers: 10.3390/s18124164
https://doi.org/10.3390/s18124164
Localization Reliability Improvement Using Deep Gaussian Process Regression Model
Cited by: 6
Author(s): Fei Teng, Wenyuan Tao, Chung-Ming Own
Published: over 7 years ago
Software Mentions 1
Very Likely Science (85)