Papers: 10.3390/rs9030296
https://doi.org/10.3390/rs9030296
A 30+ Year AVHRR Land Surface Reflectance Climate Data Record and Its Application to Wheat Yield Monitoring
Cited by: 49
Author(s): B. Franch, Éric Vermote, J. C. Roger, Emilie Murphy, Inbal Becker‐Reshef, Christopher O. Justice, Martin Claverie, Jyoteshwar Nagol, Ivan Csiszar, David Meyer, Frédéric Baret, E. Masuoka, Robert E. Wolfe, Sadashiva Devadiga
Published: over 9 years ago
Software Mentions 2
cran: DIRECT
Bayesian Clustering of Multivariate Data Under the Dirichlet-Process PriorPapers that mentioned: 81
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