Papers: 10.3390/mps2010006

https://doi.org/10.3390/mps2010006

AFM-Based Force Spectroscopy Guided by Recognition Imaging: A New Mode for Mapping and Studying Interaction Sites at Low Lateral Density

Cited by: 11
Author(s): Melanie Koehler, Anny Fis, Hermann J. Gruber, Peter Hinterdorfer
Published: over 7 years ago

Software Mentions 1

cran: AFM
Atomic Force Microscope Image Analysis
Papers that mentioned: 137
Very Likely Science (85)