Papers: 10.3390/ma7043147

https://doi.org/10.3390/ma7043147

Characterization of High-k Nanolayers by Grazing Incidence X-ray Spectrometry

Cited by: 35
Author(s): Mat­thias Müller, Philipp Hönicke, Blanka Detlefs, Claudia Fleischmann
Published: over 12 years ago

Software Mentions 1