Papers: 10.3390/ma14164749

https://doi.org/10.3390/ma14164749

Monitoring Electrical Biasing of Pb(Zr0.2Ti0.8)O3 Ferroelectric Thin Films In Situ by DPC-STEM Imaging

Cited by: 4
Author(s): Alexander Vogel, Martin F. Sarott, Marco Campanini, Morgan Trassin, Marta D. Rossell
Published: almost 5 years ago

Software Mentions 1