Papers: 10.3390/ma12010169
https://doi.org/10.3390/ma12010169
Comparing the Through-Thickness Gradient of the Deformed and Recrystallized Microstructure in Tantalum with Unidirectional and Clock Rolling
Cited by: 14
Author(s): Jialin Zhu, Shifeng Liu, Xiaoli Yuan, Liu Qing
Published: over 6 years ago
Software Mentions 2
Very Likely Science (75)
Very Likely Science (65)