Papers: 10.1371/journal.pone.0245555

https://doi.org/10.1371/journal.pone.0245555

A versatile cryo-transfer system, connecting cryogenic focused ion beam sample preparation to atom probe microscopy

Cited by: 10
Author(s): Chandra Macauley, Martina Heller, Alexander M. Rausch, Frank Kümmel, Peter Felfer
Published: over 5 years ago

Software Mentions 1