Papers: 10.1371/journal.pone.0188662

https://doi.org/10.1371/journal.pone.0188662

Genome-wide association study for grain yield and related traits in elite wheat varieties and advanced lines using SNP markers

Cited by: 63
Author(s): Shengxing Wang, Yanfang Zhu, Dexin Zhang, Hui Shao, Peng Liu, Jian-Bang Hu, Heng Zhang, Haiping Zhang, Cheng Chang, Jie Lu, Xianchun Xia, Genlou Sun, Chunyan Ma
Published: almost 9 years ago

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