Papers: 10.1371/journal.pone.0144184

https://doi.org/10.1371/journal.pone.0144184

Free Form Deformation–Based Image Registration Improves Accuracy of Traction Force Microscopy

Cited by: 22
Author(s): Álvaro Jorge-Peñas, Alicia Izquierdo-Álvarez, Rocío Aguilar-Cuenca, Miguel Vicente‐Manzanares, José Manuel García Aznar, Hans Van Oosterwyck, Elena M. De‐Juan‐Pardo, Carlos Ortíz-de-Solórzano, Arrate Muñoz-Barrutia
Published: almost 11 years ago

Software Mentions 1