Papers: 10.1371/journal.pone.0066608

https://doi.org/10.1371/journal.pone.0066608

Sub-Diffraction Nano Manipulation Using STED AFM

Cited by: 47
Author(s): Jenu V. Chacko, Claudio Canale, Benjamin Harke, Alberto Diaspro
Published: over 13 years ago

Software Mentions 1

cran: AFM
Atomic Force Microscope Image Analysis
Papers that mentioned: 137
Very Likely Science (85)