Papers: 10.1155/2021/5550311

https://doi.org/10.1155/2021/5550311

A Universal Positioning System for Coupling Characterization of SEM and AFM

Cited by: 0
Author(s): Jinchao Liu, Andi Wang, Ji Chul Yang, Shiheng Yin, Xianfeng Yang
Published: about 5 years ago

Software Mentions 1

cran: AFM
Atomic Force Microscope Image Analysis
Papers that mentioned: 137
Very Likely Science (85)