Papers: 10.1107/S2052252519011692

https://doi.org/10.1107/S2052252519011692

<i>DeepRes</i>: a new deep-learning- and aspect-based local resolution method for electron-microscopy maps

Cited by: 43
Author(s): Erney Ramírez-Aportela, Javier Mota, Pablo Conesa, José Marı́a Carazo, C.O.S. Sorzano
Published: almost 7 years ago

Software Mentions 1