Papers: 10.1107/S1600576721005112

https://doi.org/10.1107/S1600576721005112

Intragranular strain estimation in far-field scanning X-ray diffraction using a Gaussian process

Cited by: 8
Author(s): Axel Henningsson, Johannes N. Hendriks
Published: over 5 years ago

Software Mentions 1