Papers: 10.1107/S1600576717005581

https://doi.org/10.1107/S1600576717005581

Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

Cited by: 12
Author(s): Ali J. Abboud, Christoph Kirchlechner, Jozef Kečkéš, T. Çonka Nurdan, S. Send, Jean‐Sébastien Micha, Olivier Ulrich, R. Hartmann, L. Strüder, U. Pietsch
Published: over 9 years ago

Software Mentions 1