Papers: 10.1107/S1399004714024134

https://doi.org/10.1107/S1399004714024134

Improved crystal orientation and physical properties from single-shot XFEL stills

Cited by: 39
Author(s): Nicholas K. Sauter, Johan Hattne, Aaron S. Brewster, Nathaniel Echols, Petrus H. Zwart, Paul D. Adams
Published: over 10 years ago

Software Mentions 1