Papers: 10.1107/S0909049513009436

https://doi.org/10.1107/S0909049513009436

Thermal deformation of cryogenically cooled silicon crystals under intense X-ray beams: measurement and finite-element predictions of the surface shape

Cited by: 41
Author(s): Lin Zhang, Manuel Sánchez del Río, G. Monaco, C. Detlefs, Thomas Roth, A. I. Chumakov, Pieter Glatzel
Published: about 12 years ago

Software Mentions 1