Papers: 10.1107/S0909049508040429

https://doi.org/10.1107/S0909049508040429

Determination of X-ray flux using silicon pin diodes

Cited by: 82
Author(s): Robin L. Owen, James M. Holton, Clemens Schulze-Briese, Elspeth F. Garman
Published: over 17 years ago

Software Mentions 1

cran: BEST
Bayesian Estimation Supersedes the t-Test
Papers that mentioned: 382
Very Likely Science (85)