Papers: 10.1093/jmicro/dfz036

https://doi.org/10.1093/jmicro/dfz036

Application of machine learning techniques to electron microscopic/spectroscopic image data analysis

Cited by: 30
Author(s): Shunsuke Muto, M. Shiga
Published: almost 7 years ago

Software Mentions 2

cran: ALS
Multivariate Curve Resolution Alternating Least Squares (MCR-ALS)
Papers that mentioned: 189
Very Likely Science (85)
cran: VCA
Variance Component Analysis
Papers that mentioned: 32
Very Likely Science (85)