Papers: 10.1038/srep44766

https://doi.org/10.1038/srep44766

Characterization of Thin Film Materials using SCAN meta-GGA, an Accurate Nonempirical Density Functional

Cited by: 48
Author(s): Ioana Buda, Christopher Lane, B. Barbiellini, Adrienn Ruzsinszky, Jianwei Sun, Arun Bansil
Published: over 9 years ago

Software Mentions 1