Papers: 10.1038/srep39754

https://doi.org/10.1038/srep39754

The role of Frenkel defect diffusion in dynamic annealing in ion-irradiated Si

Cited by: 12
Author(s): J. B. Wallace, L. B. Bayu Aji, Aiden A. Martin, S. J. Shin, Lin Shao, S. O. Kucheyev
Published: over 9 years ago

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