Papers: 10.1038/srep16393

https://doi.org/10.1038/srep16393

Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging

Cited by: 69
Author(s): Maja Ðukić, Jonathan D. Adams, Georg E. Fantner
Published: over 10 years ago

Software Mentions 1

cran: AFM
Atomic Force Microscope Image Analysis
Papers that mentioned: 137
Very Likely Science (85)