Papers: 10.1038/srep09095
https://doi.org/10.1038/srep09095
The relationship between grain boundary structure, defect mobility and grain boundary sink efficiency
Cited by: 133
Author(s): Blas P. Uberuaga, Louis J. Vernon, E. Martínez, Arthur F. Voter
Published: over 11 years ago
Software Mentions 1
pypi: AMD
Advanced Data Science enabled Data extraction and control library for Arduino with accurate Data Visualizations !.Papers that mentioned: 66
Very Likely Science (75)