Papers: 10.1038/srep04886

https://doi.org/10.1038/srep04886

Quantitatively estimating defects in graphene devices using discharge current analysis method

Cited by: 15
Author(s): Ukjin Jung, Young Gon Lee, Chang Goo Kang, Sangchul Lee, Jin Ju Kim, Hyeon June Hwang, Sung Kwan Lim, Moon Ho Ham, Byoung Hun Lee
Published: about 11 years ago

Software Mentions 1