Papers: 10.1038/s41598-021-84308-4
https://doi.org/10.1038/s41598-021-84308-4
Elucidating the genetics of grain yield and stress-resilience in bread wheat using a large-scale genome-wide association mapping study with 55,568 lines
Cited by: 11
Author(s): Philomin Juliana, Ravi P. Singh, Jesse Poland, Sandesh Shrestha, Julio Huerta‐Espino, Velu Govindan, Suchismita Mondal, Leonardo Crespo‐Herrera, Uttam Kumar, Arun Kumar Joshi, Thomas Payne, Pradeep Kumar Bhati, Vipin Tomar, Franjel Consolacion, Jaime Amador Campos Serna
Published: over 4 years ago
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Create Elegant Data Visualisations Using the Grammar of GraphicsPapers that mentioned: 11,441
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