Papers: 10.1038/s41598-020-68321-7

https://doi.org/10.1038/s41598-020-68321-7

Characterizing transition-metal dichalcogenide thin-films using hyperspectral imaging and machine learning

Cited by: 2
Author(s): Brian Shevitski, Christopher T. Chen, Christoph Kastl, Tevye Kuykendall, Adam Schwartzberg, Shaul Aloni, Alex Zettl
Published: about 5 years ago

Software Mentions 1