Papers: 10.1038/s41598-019-52690-9

https://doi.org/10.1038/s41598-019-52690-9

Imaging low-dimensional nanostructures by very low voltage scanning electron microscopy: ultra-shallow topography and depth-tunable material contrast

Cited by: 28
Author(s): Laura Zarraoa, María Ujué González, Álvaro San Paulo
Published: about 7 years ago

Software Mentions 1

cran: TEAM
Multiple Hypothesis Testing on an Aggregation Tree Method
Papers that mentioned: 88
Very Likely Science (83)