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Papers: 10.1007/s00122-020-03532-0

https://doi.org/10.1007/s00122-020-03532-0

Genetic characterization and genome-wide association mapping for dwarf bunt resistance in bread wheat accessions from the USDA National Small Grains Collection

Cited by: 6
Author(s): Tyler Gordon, Rui Wang, David Hole, Harold E. Bockelman, J. M. Bonman, Jianli Chen
Published: almost 7 years ago

Software Mentions 2

cran: ui
Uncertainty Intervals and Sensitivity Analysis for Missing Data
Papers that mentioned: 4
Very Likely Science (85)
pypi: ui
Simple menu-driven user interface for the terminal
Papers that mentioned: 4
Very Likely Science (65)