Papers: 10.1002/advs.201901391

https://doi.org/10.1002/advs.201901391

Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy

Cited by: 42
Author(s): Oh Heon Kwon, Daehee Seol, Huimin Qiao, Yunseok Kim
Published: almost 6 years ago

Software Mentions 1